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Graduate School of Science and Engineering Ehime University | 論文
- 病原微生物の生態学 : 疾病を予知するために
- Chiral Bead-like Trimer of Tris(2,4-pentanedionato)ruthenium(III)
- The Bacterial Stringent Response, Conserved in Chloroplasts, Controls Plant Fertilization
- Neural Network Equalizer Matched to Recording Code in Holographic Data Storage
- Erratum: “Plasma Decomposition of Clathrate Hydrates by 2.45 GHz Mircowave Irradiation at Atmospheric Pressure”
- Performance of Viterbi Decoder for FM Recording Code Considering Noise Correlation
- Partial Response System and Viterbi Decoding for FM Recording Code
- Enantioselective Sensing by Luminescence from Cyclometalated Iridium(III) Complexes Adsorbed on a Colloidal Saponite Clay
- New Medium for the Production of Exopolysaccharide (OSKC) by Lactobacillus kefiranofaciens
- Preparation of MgFe2O4 microsphere using spray dryer for embolization therapy application
- High-Quality InGaAs Layers Grown on (411)A-Oriented InP Substrates by Molecular Beam Epitaxy
- Super-Flat Interfaces in Pseudomorphic In_xGa_As/Al_Ga_As Quantum Wells with High In Content (x = 0.15) Grown on (411)A GaAs Substrates by Molecular Beam Epitaxy
- 830-nm Polarization Controlled Lasing of InGaAs Quantum Wire Vertical-Cavity Surface-Emitting Lasers Grown on (775)B GaAs Substrates by Molecular Beam Epitaxy
- Large Anisotropy of Electron Mobilities in Laterally Modulated Two-Dimensional Systems Grown on the (775)B-Oriented GaAs Substrates by Molecular Beam Epitaxy(Structure, Interfaces, and Films)
- Sharp Transmission Coefficient in GaAs/AlAs Resonant Tunneling Diodes with (411) A Superflat Interfaces Grown by Molecular Beam Epitaxy
- High-Reliability Lithography Performed by Ultrasonic and Surfactant-Added Developing System
- High-Sensitivity and High-Resolution Contact Hole Patterning by Enhanced-Wettability Developer
- Non-centrosymmetric behavior of a clay film ion-exchanged with chiral metal complexes
- Hazard Map of a Small Island : A Case Study of Kashima Island for Slope Stability in Japan(Turkey-Japan Joint Conference on Geomorphology)
- A Reduced Scan Shift Method for Sequential Circuit Testing (Special Section on VLSI Design and CAD Algorithms)