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Department Of Materials Science And Engineering Kaist | 論文
- Effects of the Deposition Conditions of the Seed Layer on the Crystallinity and Electrical Characteristics of the Pb(Zr, Ti)O_3 Films
- Effect of Activation of Oxygen by Electron Cyclotron Resonance Plasma on the Incorporation of Pb in the Deposition of Pb(Zr,Ti)O_3 Films by DC Magnetron Reactive Sputtering
- Investigation of Pt/Ti Bottom Electrodes for Pb(Zr, Ti)O_3 Films
- Composition Control of Lead Zirconate Titanate Thin Films in Electron Cyclotron Resonance Plasma Enhanced Chemtical Vapor Deposition System
- Hydrogen Adsortion in Periodic Mesoporous Organic- and Inorganic-Silica Materials at Room Temperature
- Microstructural Evolution of Joint Interface between Eutectic 80Au-20Sn Solder and UBM
- Abnormal Grain Growth of Ni_3Sn_4 at Sn-3.5Ag/Ni Interface
- Effect of Under Bump Metallurgy and Reflows on Shear Strength and Microstructure of Joint between Cu Substrate and Sn-36Pb-2Ag Solder Alloy
- Thermodynamics-Aided Alloy Design and Evaluation of Pb-free Solders for High-Temperature Applications
- Investigation of Silicon Oxide Thin Films Prepared by Atomic Layer Deposition Using SiH_2Cl_2 and O_3 as the Precursors
- Atomic Layer Deposition of TiN Films by Alternate Supply of Tetrakis (ethylmethylamino)-Titanium and Ammonia
- Undercooling, Microstructures and Hardness of Sn-Rich Pb-Free Solders on Cu-xZn Alloy Under Bump Metallurgies
- Diffusional Solidification Behavior in 304 Stainless Steel
- Risedronate Directly Inhibits Osteoclast Differentiation and Inflammatory Bone Loss
- Effects of the Partial Pressure of Copper(I)Hexafluoroacetylacetonate Trimethylvinylsilane on the Chemical Vapor Deposition of Copper
- Effects of the Annealing in Ar and H_2/Ar Ambients on the Microstructure and the Electrical Resistivity of the Copper Film Prepared by Chemical Vapor Deposition
- The Effects of the Preparation Conditions and Heat-Treatment Conditions of Pt/Ti/SiO_2/Si Substrates on the Nucleation and Growth of Pb(Zr, Ti)O_3 Films
- Effect of a TiO_2 Buffer Layer on the C-V Properties of Pt/PbTiO_3/TiO_2/Si Structure
- Crystallization Behavior of Co_Fe_B_ Electrode Layers in Annealed Magnetic Tunnel Junctions
- Imprint of Oriented Pb(Zr,Ti)O_3 Thin Films with Oxygen Atmosphere in Cooling Process