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Central Research Laboratory Hitachi Lid. | 論文
- A Superconducting Quantum Interference Device Magnetometer with a Room-Temperature Pickup Coil for Measuring Impedance Magnetocardiograms
- Strain-Imaging Observation of Pb(Zr, Ti)O_3 Thin Films
- Strain Imaging of Lead-Zirconate-Titanate Thin Film by Tunneling Acoustic Microscopy
- Tunneling Acoustic Microscope
- InGaAsP/InP Laser Diodes Mounted on Semi-Insulating SiC Ceramics : B-2: LD AND LED-1
- Low-Temperature Etching for Deep-Submicron Trilayer Resist
- A DC-Gas Discharge Display Device for Data Information Systems
- Molecular and Cellular Regulation of Renal Phosphate Transporters in X-Linked Hypophosphatemia
- High-Efficiency, High-Luminance Gas-Discharge Mode for Color TV Display
- Amorphous-Se/GaAs : A Novel Heterostructure for Solid-State Devices
- Low-Temperature Annealing Effect on Bi-Sr-Ca-Cu-O Thin Films Prepared by Layer-by-Layer Deposition
- Thin Film Growth of YBa_2Cu_3O_ by ECR Oxygen Plasma Assisted Reactive Evaporation
- In-line Optical Lever System for Ultrasmall Cantilever Displacement Detection
- Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
- A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
- Effect of Purge Time on the Properties of HfO_2 Films Prepared by Atomic Layer Deposition(High-κ Gate Dielectrics)
- Variable-Energy Positron Studies of Vacancy-Type Defects in TiN Films on Si
- Simplified AC Photovoltaic Measurermemt of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults
- Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing
- Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method : Techniques, Instrumentations and Measurement