スポンサーリンク
Central Research Institute, Mitsubishi Material Corporation | 論文
- New Low Temperature Processing of Sol-Gel SrBi_2Ta_2O_9 Thin Films
- Influence of Buffer Layers and Excess Pb/Zr+Ti Ratios on Fatigue Characteristics of Sol-Gel-Derived Pb(Zr, Ti)O_3 Thin Films
- Influence of Buffer Layers on Microstructural and Ferroelectric Characteristics of Sol-Gel Derived PbZr_xTiO_3 Thin Films ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Preparation of Pb(Zr,Ti)O_3 Films on Pi/Ti/Ta Electrodes by Sol-Get Process
- Change of Structure and Electrical Properties of FeSi_2 Thin Film during Annealing
- Effects of Some Additives on Thermoelectric Properties of FeSi_2 Thin Films
- The Composition Dependence of Some Electrical Properties of FeSi_x Thin Films
- Composition Dependence of Some Electrical Properties of Fe_M_ySi_x (M=Cr, Co) Thin Films