Effects of Some Additives on Thermoelectric Properties of FeSi_2 Thin Films
スポンサーリンク
概要
- 論文の詳細を見る
Effects of some additives (V, Cr, Mn, Co, Ni, Pd, Pt) on thermoelectric properties of FeSi_2 thin films were studied. V, Cr or Mn-doped FeSi_2 films were of p-type semiconductor and Co, Ni, Pd and Pt-doped FeSi_2 films of n-type semiconductor. It was indicated that V or Cr are more suitable additives in thermoelectric properties of p-type FeSi_2 than Mn and that Pt is superior to other additives in thermoelectric properties of n-type FeSi_2.
- 社団法人応用物理学会の論文
- 1991-02-15
著者
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Ido S
Faculty Of Engineering Saitama University
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Ido Shunji
Department Of Electrical Engineeing Faculty Of Engineering Saitama University
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KOMABAYASHI Masashi
Central Research Institute, Mitsubishi Material Corporation
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HIJIKATA Ken-ichi
Central Research Institute, Mitsubishi Material Corporation
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Komabayashi M
Mitsubishi Materials Corp. Omiya
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Hijikata Kenichi
Mitsubishi Material Corporation Central Research Institute
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Komabayashi Masashi
Central Research Institute Mitsubishi Materials Corporation
関連論文
- Magnetic Field Analyses by Using Free Mesh Method and Their Visualization
- Computational Studies on Plasma Generation and Erosion in a Rectangular Magnetron Sputtering System
- Change of Structure and Electrical Properties of FeSi_2 Thin Film during Annealing
- Effects of Some Additives on Thermoelectric Properties of FeSi_2 Thin Films
- The Composition Dependence of Some Electrical Properties of FeSi_x Thin Films
- Particle Orbit Simulations on Ion Loss at the Edge of a Tokamak with Separatrix Configuration
- Composition Dependence of Some Electrical Properties of Fe_M_ySi_x (M=Cr, Co) Thin Films
- Measurements of Plasma Controlled by Compressed Magnetic Field Magnetron Sputtering Technique
- Simulations of Electron Orbits in a Bucket-Type Ion Source
- Computational Studies on the Shape and Control of Plasmas in Magnetron Sputtering Systems