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Advanced Nano-characterization Center, National Institute for Materials Science | 論文
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- Development of a stage-scanning system for high-resolution confocal STEM
- Design features of a new ultra-high vacuum electron microscope with an omega filter
- Deep-Level Optical Spectroscopy Investigation of Band Gap States in AlGaN/GaN Hetero-Interfaces
- Study of Defects and Strains on Cleaved GaAs (110) Surface by Reflection Electron Microscopy
- Observation of GaAs(110)Surface Defect by Reflection Electron Holography
- Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis
- Relationship between X-ray Intensity and Electric Bias on Al_2O_3 Surface during Low Energy Ga^+ Irradiation
- Amorphous-like nanostructures stabilized in nanometre-sized alloy clusters (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- Structural observation of Pd silicide islands on Si(111) surfaces with UHV-TEM/STM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
- High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface
- New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves
- High Resolution Transmission Electron Microscopy Study on the Structure of Ge Nanoparticles by Using an Ultrahigh Vacuum-Molecular Beam Epitaxy-Transmission Electron Microscope System
- Observation of Reconstructed Pt(100) Surface by Reflection Electron Microscopy
- HRTEM observation of BN films segregated on stainless steel SUS304 by low temperature heat treatment (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)