Jang Se-Aug | Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

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概要

• Jang Se-Augの詳細を見る
• 同名の論文著者
• Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Koreaの論文著者

関連著者

• Cho Heung-jae

  Memory R&d Division Hynix Semiconductor Inc.

• Lim Kwan-yong

  Memory R&d Division Hynix Semiconductor Inc.

• Yang Hong-seon

  Memory R&d Division Hynix Semiconductor Inc.

• Jang Se-aug

  Memory R&d Division Hynix Semiconductor Inc.

• Kim Tae-yoon

  Memory R&d Division Hynix Semiconductor Inc.

• Kim Yong

  Memory R&d Division Hynix Semiconductor Inc.

• Sung Min

  Memory R&d Division Hynix Semiconductor Inc.

• Lee Seung

  Memory R&d Division Hynix Semiconductor Inc.

• Kim Jin

  Memory Division Samsung Electronics Corporation

• Ku Ja-Chun

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Lim Kwan-Yong

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Cho Heung-Jae

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Jang Se-Aug

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Kim Tae-Yoon

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Yang Hong-Seon

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Kim Jin

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

• Sung Min

  Memory R&D Division, Hynix Semiconductor Inc., Ichon P.O. Box 1010, Ichon-si, Kyoungki-do 467-701, Korea

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著作論文

• Gate Oxide Reliability Characterization of Tungsten Polymetal Gate with Low-Contact-Resistive WSix/WN Diffusion Barrier in Memory Devices

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