Lee Jung-Han | Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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概要
- Lee Jung-Hanの詳細を見る
- 同名の論文著者
- Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Koreaの論文著者
関連著者
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KANG Kwon-Chil
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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LEE Joung-Eob
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Shin Hyungcheol
Inter-university Semiconductor Research Center (isrc)
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Lee Jong-Ho
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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Lee Jung-Han
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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Kim Garam
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and Department of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Republic of Korea
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PARK Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering and Compu
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Yun Jang-gn
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Compu
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Kim Garam
Inter-university Semiconductor Research Center (isrc) And School Of Electrical Engineering And Computer Science Seoul National University
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Park Byung-Gook
Inter-University Semiconductor Research Center (ISRC) and School of Electrical and Computer Science, Seoul National University, San 56-1, Sillim-dong, Gwanak-ku, Seoul 151-742, Republic of Korea
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Wan Kim
Inter-University Semiconductor Research Center (ISRC)
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Kim Dae-hwan
School Of Electrical Engineering Kookmin University
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SHIM Won
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University
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Lee Jong-Ho
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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Park Byung-Gook
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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Lee Joung-Eob
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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Shim Won
Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea
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Kang Kwon-Chil
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Korea
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Kim Kyung-Wan
Inter-University Semiconductor Research Center and School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea
著作論文
- Room-Temperature Operation of a Single-Electron Transistor Made by Oxidation Process Using the Recessed Channel Structure
- Dual Gate Single-Electron Transistors with a Recessed Channel and Underlapped Source/Drain Structure
- Dynamic driving current using side gate bias of single-electron transistors