Kikuta Daigo | Toyota Central R&D Labs. Inc., Nagakute, Aichi 480-1192, Japan
スポンサーリンク
概要
関連著者
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Uesugi Tsutomu
Toyota Central R&d Laboratories Inc.
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Kachi Tetsu
Toyota Central R & D Laboratories Inc.
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Kikuta Daigo
Toyota Central R&D Labs. Inc., Nagakute, Aichi 480-1192, Japan
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Narita Tetsuo
Toyota Central R&D Labs. Inc., Nagakute, Aichi 480-1192, Japan
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Kutsuki Katsuhiro
Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
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HASHIZUME Tamotsu
Graduate School of Electronics and Information Engineering, and Research Center for Interface Quantu
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Kachi Tetsu
Toyota Central R&D Labs. Inc., Nagakute, Aichi 480-1192, Japan
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Iguchi Hiroko
Toyota Central R&D Labs. Inc., Nagakute, Aichi 480-1192, Japan
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Kim Sungsik
Graduate School of Information and Science Technology and Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Sapporo 060-8628, Japan
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Hori Yujin
Graduate School of Information and Science Technology and Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Sapporo 060-8628, Japan
著作論文
- Interface Properties of Al2O3/n-GaN Structures with Inductively Coupled Plasma Etching of GaN Surfaces
- Reliability Evaluation of Al
- Reliability Evaluation of Al₂O₃ Deposited by Ozone-Based Atomic Layer Deposition on Dry-Etched n-Type GaN (Special Issue : Recent Advances in Nitride Semiconductors)