Horikoshi Yoshiji | The Musashino Electrical Communication Laboratory
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概要
関連著者
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Horikoshi Yoshiji
The Musashino Electrical Communication Laboratory
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HORIKOSHI Yoshiji
The Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Horikoshi Yoshiji
The Musashino Electrical Communication Laboratory N.t.t.
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Takanashi Yoshifumi
The Musashino Electrical Communication Laboratory N.t.t.
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Furukawa Yoshitaka
The Musashino Electrical Communication Laboratory N.t.t.
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Horikoshi Yoshiji
Musashino Electrical Communication Laboratories Nippon Telegraph And Telephone Public Corporation
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Saito Hisao
Musashino Electrical Communication Laboratories Nippon Telegraph And Telephone Public Corporation
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Saito Hisao
The Musashino Electrical Communication Laboratory
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Iwane Genzo
The Musashino Electrical Communication Laboratory N.t.t.
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Kawashima Minoru
Musashino Electrical Communication Laboratories Nippon Telegraph And Telephone Public Corporation
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KAWASHIMA Minoru
The Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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TAKANASHI Yoshifumi
The Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Saito Hideho
The Musashino Electrical Communication Laboratory
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Takanashi Yoshifumi
Musashino Electrical Communication Laboratory N.t.t.
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Takanashi Yoshifumi
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Furukawa Yoshitaka
The Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Horikoshi Yoshiji
The Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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HORIKOSHI Yoshiji
The Musashino Electrical Communication Laboratory, N.T.T.,
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HORIKOSHI Yoshiji
The Musashino Electrical Communication Laboratory, N.T.T.
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IWANE Genzo
The Musashino Electrical Communication Laboratory, N.T.T.,
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FURUKAWA Yoshitaka
The Musashino Electrical Communication Laboratory,N.T.T.,
著作論文
- Low-Temperature Behavior of the Threshold Current and Carrier Lifetime of InGaAsP-InP DH Lasers
- Degradation of InGaAsP-InP DH Lasers by In Solder
- Improved Sensitivity of Junction Capacitance Method Suitable for the Trap Evaluation in Stripe Geometry DH Lasers
- Effect of the Thermal Damage Introduced to GaAs Substrate during the GaAs, (AlGa)As LPE Process
- Epitaxial Growth of (AIGa)As and GaAs on (AlGa)As Substrate
- Temperature Sensitive Threshold Current of InGaAsP-InP Double Heterostructure Lasers
- Efficient Coupling between Chalcogenide Glass Radiator Bonded LEDs with Optical Guide Structure and Optical Fibers
- High Radiance Light-Emitting Diodes
- A New Liquid Phase Epitaxial Growth Method for the Growth of (AlGa)As, GaAs Multilayers
- Field Effect of GaAs Photoluminescence in the GaP-GaAs and Ga_Al_As-GaAs Heterojunctions