Chen Shiue-lung | Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
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概要
- CHEN Shiue-Lungの詳細を見る
- 同名の論文著者
- Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.の論文著者
関連著者
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Chen Shiue-lung
Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
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Wang Shui-jinn
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Chen Tron-min
Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
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Liou Bor-wen
Department Of Computer Science And Information Engineering Wu-feng Institute Of Technology
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UANG Kai-Ming
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Wang Shui-jinn
Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
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CHEN Shiue-Lung
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Uang Kai-ming
Dept. Of Electrical Eng. Wu Feng Institute Of Technology
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CHEN Tron-Min
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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CHANG Shu-Cheng
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Kuo Hon-yi
Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
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KUO Hon-Yi
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Wu Chin-kun
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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UANG Kai-Ming
Dept. of Electrical Eng., Wu-Feng Institute of Technology
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LIOU Bor-Wen
Dept. of Computer Science and Information Eng., Wu-Feng Institute of Technology
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WU Chin-Kun
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Yang Yu-cheng
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Hsiao Tung-sheng
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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CHEN Tron-Min
Department of Electrical Engineering, Wu-Feng Institute of Technology
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Yang Su-hua
National Kaohsiung University Of Applied Sciences Department Of Electronic Engineering
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KUO Der-Ming
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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HSIAO Tung-Sheng
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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YANG Yu-Cheng
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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CHEN Tron-Min
Dept. of Electrical Eng., Wu-Feng Institute of Technology
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KUAN Hon
Department of Electrical Engineering, Far East University
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WANG Pei-Ren
Institute of Microelectronics, Dept. of Electrical Eng., National Cheng Kung Univ.
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TSAI Ching-Chung
Institute of Microelectronics, Dept. of Electrical Eng., National Cheng Kung Univ.
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KUAN Hon
Optoelectronics Center of Far East Univ.
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Wang Yu-yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Kuo Der-ming
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Tsai Ching-chung
Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
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Chang Shu-Cheng
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Chen Tron-Min
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Chen Tron-Min
Department of Electrical Engineering, WuFeng Institute of Technology, Chiayi 621, Taiwan, R.O.C.
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Uang Kai-Ming
Department of Electrical Engineering, WuFeng Institute of Technology, Chia-yi Country 621, Taiwan, Republic of China
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Uang Kai-Ming
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Uang Kai-Ming
Department of Electrical Engineering, WuFeng Institute of Technology, Chiayi 621, Taiwan, R.O.C.
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LEE Wei-Chi
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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WANG Pei-Ren
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Wang Shui-Jinn
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Wang Shui-Jinn
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.
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Kuan Hon
Department of Electrical Engineering Far East College, Tainan 744, Taiwan
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Liou Bor-Wen
Department of Computer Science and Information Engineering, Wu-Feng Institute of Technology, Chiayi 621, Taiwan, Republic of China
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Wu Chin-Kun
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Kuan Hon
Department of Electro-Optical Engineering, Southern Taiwan University of Technology, Tainan 701, Taiwan, R.O.C.
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Chen Shiue-Lung
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Chen Shiue-Lung
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.
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Wang Yu-Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.
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Hsiao Tung-Sheng
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
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Kuo Hon-Yi
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China
著作論文
- High-Power GaN-Based Light-Emitting Diodes with Transparent Indium Zinc Oxide Films
- Junction Temperature and Thermal Resistance Measurement in High-Power Light Emitting Diodes Using A Real-Time Diode Forward Voltage Sampling Technique
- A Vertical-Structured Ni/GaN Schottky Barrier Diode Using Electroplating Nickel Substrate
- Effect of Surface Treatment on the Performances of Vertical-structure GaN-based High-power LEDs with Electroplating Metallic Substrate
- High Power GaN-Based LEDs with Transparent Indium-Zinc-Oxide Films
- A Novel Sn-based Metal Substrate Technology for the Fabrication of Vertical-Structure GaN-Based High Power Light-Emitting Diodes
- Effect of Surface Treatment on the Performance of Vertical-Structure GaN-Based High-Power Light-Emitting Diodes with Electroplated Metallic Substrates (Special Issue: Solid State Devices & Materials)
- Enhanced Performance of Vertical GaN-Based Light-Emitting Diodes with a Current-Blocking Layer and Electroplated Nickel Substrate
- A Vertical-Structured Ni/GaN Schottky Barrier Diode Using Electroplating Nickel Substrate
- Effect of Surface Treatment on the Performance of Vertical-Structure GaN-Based High-Power Light-Emitting Diodes with Electroplated Metallic Substrates
- High-Power GaN-Based Light-Emitting Diodes with Transparent Indium Zinc Oxide Films