Komatsu T | Hokkaido Univ. Education Hakodate Jpn
スポンサーリンク
概要
関連著者
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Komatsu T
Hokkaido Univ. Education Hakodate Jpn
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MIYASAKA Mitsutoshi
Seiko Epson Corporation, Technology Platform Research Center
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OHSHIMA Hiroyuki
SEIKO EPSON CORPORATION, TFT Research Laboratory
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Ohshima Hiroyuki
Seiko Epson Corporation Base Technology Research Center
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Ohshima H
Seiko Epson Corp. Nagano Jpn
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KOMATSU Tadakazu
Seiko Epson Corporation, Analysis Center
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Miyasaka M
Seiko Epson Corp. Nagano Jpn
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Miyasaka Mitsutoshi
Seiko Epson Corporation Base Technology Research Center
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YUDASAKA Ichio
SEIKO EPSON CORPORATION, TFT Research Laboratory
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Itoh W
Research Laboratory Taito Co. Ltd.
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Itoh Wataru
Research Laboratory Taito Co.
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Yudasaka I
Seiko Epson Corporation Active Device Research Laboratory
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Yudasaka Ichio
Seiko Epson Corporation Tft
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Takeyama S
Matsushita Res. Inst. Tokyo Inc. Kawasaki Jpn
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TAKEYAMA Shojiro
Himeji Institute of Technology, Faculty of Science
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KOMATSU Teruo
Department of Physics, Osaka City University
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Takeyama S
Himeji Inst. Technol. Hyogo Jpn
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Takeyama Shojiro
Nstitute For Solid State Physics University Of Tokyo
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WATANABE Katsuyosi
Department of Physics, Faculty of Liberal Arts and Education, Yamanashi University
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Yamaguchi Akemi
Seiko Epson Corporation Analysis Center
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Watanabe Katsuyosi
Department Of Physics Faculty Of Liberal Arts And Education Yamanashi University
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Itoh Wataru
Seiko Epson Corporation Analysis Center
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Komatsu Teruo
Department Of Physics Faculty Of Science Osaka City University
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Shimodaira Akemi
Seiko Epson Corporation, Analysis Center
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ITOH Wataru
MIM Research Laboratory
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Komatsu T
Osaka City Univ. Osaka Jpn
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Shimodaira Akemi
Seiko Epson Corporation Analysis Center
著作論文
- Thin-Film Single-Crystal Growth of BiI_3 by a Hot Wall Technique
- Oxidation of Amorphous Silicon for Superior Thin Film Transistors
- Oxidation of Amorphous Silicon for Superior Thin Film Transistors (OASIS TFT)
- Effects of Channel Thickness on Poly-Crystalline Silicon Thin Film Transistors
- Application of As-Deposited Poly-Crystalline Silicon Films to Low Temperature CMOS Thin Film Transistors
- Wettability of Silicon Oxide with Poly-Crystalline Silicon