Alay Josep | Research Center For Integrated Systems Hiroshima University
スポンサーリンク
概要
関連著者
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HIROSE Masataka
Department of Electrical Engineering, Hiroshima University
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ALAY Josep
Research Center for Integrated Systems, Hiroshima University
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Alay Josep
Research Center For Integrated Systems Hiroshima University
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Hirose Masataka
Department Of Electrical Engineering Faculty Of Engineering Hiroshima University
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Hirose Masataka
Department Of Electrical Engineering Graduate School Of Advanced Sciences Of Matter Hiroshima Univer
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Hirose Masataka
Advanced Semiconductor Research Center National Institute Of Advanced Industrial Science And Technol
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Yokoyama S
Hiroshima Univ. Higashi‐hiroshima Jpn
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YOKOYAMA Shin
Research Center for Nanodevices and Systems, Hiroshima University
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FUKUDA Masatoshi
Department of Electrical Engineering, Hiroshima University
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NAKAGAWA Kazuyuki
Department of Electrical Engineering, Hiroshima University
著作論文
- Quantitative Analysis of Tunneling Current through Ultrathin Gate Oxides
- Determination of Valence Band Alignment at Ultrathin SiO_2/Si Interfaces by High-Resolution X-Ray Photoelectron Spectroscopy
- Valence Band Alignment at Ultra-Thin SiO_2/Si(111) Interfaces as Determined by High-Resolution X-Ray Photoelectron Spectroscopy
- Valence Band Alignment at Ultra-Thin SiO_2/Si(111) Interfaces as Determined by High-Resolution X-Ray Photoelectron Spectroscopy
- Early Stages of Oxidation of Clean Si(111)-7x7 and Si(100)-2x1 Surfaces Studied by In-Situ High Resolution X-Ray Photoelectron Spectroscopy