Ueki Takemi | NTT Electronics Corporation
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概要
関連著者
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Ueki Takemi
NTT Electronics Corporation
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Ueki Takemi
Ntt Electronics Corp.
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UEKI Takemi
NTT LSI Laboratories
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Takeda Toshikazu
Murata Manufacturing Co. Ltd.
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Itsumi M
Ntt Electronics Corp.
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Takeda T
Murata Manufacturing Co. Ltd.
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Takeda Takayuki
Department Of Electronic Engineering Aichi Institute Of Technology
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Takeda Tatsuoki
Department Of Thermonuclear Fusion Research Naka Fusion Estaklishment Japan Atomic Energy Research I
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ITSUMI Manabu
System Electronics Laboratories
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TAKEDA Tadao
System Electronics Laboratories
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Nakajima Shigeki
Department Of Electrical Engineering Faculty Of Science And Technology Kinki University
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Nakajima Sadanojo
Department Of Electrical And Electronic Engineering The University Of Tokushinna
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Nakajima S
Ntt Electronics Corp.
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Nogiwa Seiji
Optical Measurement Technology Development Co. Ltd.:ando Electric Co. Ltd.
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NAKAJIMA Sigeru
NTT Electronics Corp.
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Takaoka Akio
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Maeda Masahiko
Ntt Telecommunications Energy Technology Laboratories
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Itsumi Manabu
NTT Lifestyle and Environment Technology Laboratories
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Ohfuji Shin-ichi
NTT Lifestyle and Environment Technology Laboratories
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INOUE Naohisa
Research Institute for Advanced Science and Technology, Osaka Prefecture University
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Yabumoto N
Ntt Advanced Technol. Corp. Atsugi‐shi Jpn
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Yabumoto Norikuni
Ntt Advanced Technology Corporation
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Ueki T
Ntt Electronics Corp.
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Inoue Naohisa
Research Institute For Advanced Science And Technology Osaka Prefecture University
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Itsumi Manabu
Ntt System Electronics Laboratories
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WATANABE Masaki
NTT Electronics Corporation
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Komine Yukio
Ntt Microsystem Integration Labs. Ntt Corp.
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Takaoka Akio
Research Center For Uhvem Osaka Univ.
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YOSHIDA Kiyokazu
Research Center for UHVEM Osaka Univ.
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ITSUMI Manabu
NTT Electronics Corp.
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Itsumi Manabu
Lifestyle and Environment Technology Laboratories, NTT
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Takeda Tadao
Lifestyle and Environment Technology Laboratories, NTT
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Inoue N
National Defense Acad. Yokosuka
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ITSUMI Manabu
System Electronics Laboratories, NTT
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TAKEDA Tadao
System Electronics Laboratories, NTT
著作論文
- Two Kinds of Impurity-related Mark on Thermal Oxides Originating in Octahedral Void Defects
- Gate Oxide Defects in MOSLSIs and Octahedral Void Defects in Czochralski Silicon
- Shrinkage of Grown-in Defects in Czochralski Silicon During Thermal Annealing in Vacuum
- Observation of Shrinkage Process by Annealing of Grown-in Defect in Cz-Si Crystal
- Carbon in Grown-in Defects in Czoehralski Silicon and Its Influence on Gate-Oxide Defects
- Analysis of Side-Wall Structure of Grown-in Twin-Type Octahedral Defects in Czochralski Silicon
- Octahedral Void Structure Observed in Grown-In Defects in the Bulk of Standard Czochralski-Si for MOS LSIs