UEKI Takemi | NTT LSI Laboratories
スポンサーリンク
概要
関連著者
-
UEKI Takemi
NTT LSI Laboratories
-
Itsumi M
Ntt Electronics Corp.
-
Ueki Takemi
NTT Electronics Corporation
-
Takeda Toshikazu
Murata Manufacturing Co. Ltd.
-
Takeda Takayuki
Department Of Electronic Engineering Aichi Institute Of Technology
-
Takeda Tatsuoki
Department Of Thermonuclear Fusion Research Naka Fusion Estaklishment Japan Atomic Energy Research I
-
Takeda T
Murata Manufacturing Co. Ltd.
-
Ueki Takemi
Ntt Electronics Corp.
-
Nakajima Shigeki
Department Of Electrical Engineering Faculty Of Science And Technology Kinki University
-
Nakajima Sadanojo
Department Of Electrical And Electronic Engineering The University Of Tokushinna
-
Nakajima S
Ntt Electronics Corp.
-
Nogiwa Seiji
Optical Measurement Technology Development Co. Ltd.:ando Electric Co. Ltd.
-
ITSUMI Manabu
System Electronics Laboratories
-
TAKEDA Tadao
System Electronics Laboratories
-
NAKAJIMA Sigeru
NTT Electronics Corp.
-
Takaoka Akio
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
-
Yamada Junzo
Ntt Telecommunications Energy Laboratories
-
Yamada Junzo
Ntt Technology Research Department
-
DOUSEKI Takakuni
NTT LSI Laboratories
-
INOUE Naohisa
Research Institute for Advanced Science and Technology, Osaka Prefecture University
-
Douseki T
Ntt Corp. Atsugi‐shi Jpn
-
Mutoh Shin'ichiro
Ntt Lsi Laboratories
-
Ueki T
Ntt Electronics Corp.
-
Ueki Takemi
Lsi Laboratories Ntt
-
Inoue Naohisa
Research Institute For Advanced Science And Technology Osaka Prefecture University
-
Komine Yukio
Ntt Microsystem Integration Labs. Ntt Corp.
-
Takaoka Akio
Research Center For Uhvem Osaka Univ.
-
YOSHIDA Kiyokazu
Research Center for UHVEM Osaka Univ.
-
ITSUMI Manabu
NTT Electronics Corp.
-
Itsumi Manabu
Lifestyle and Environment Technology Laboratories, NTT
-
Takeda Tadao
Lifestyle and Environment Technology Laboratories, NTT
-
ITSUMI Manabu
LSI Laboratories, NTT
-
TAKEDA Tadao
LSI Laboratories, NTT
-
Itsumi Manabu
Lsi Laboratories Ntt
-
Inoue N
National Defense Acad. Yokosuka
著作論文
- Evaluation of Soft-Error Immunity for 1-V CMOS Memory Cells with MTCMOS Technology (Special Issue on Microelectronic Test Structure)
- Shrinkage of Grown-in Defects in Czochralski Silicon During Thermal Annealing in Vacuum
- Observation of Shrinkage Process by Annealing of Grown-in Defect in Cz-Si Crystal
- Carbon in Grown-in Defects in Czoehralski Silicon and Its Influence on Gate-Oxide Defects
- Octahedral Void Structure Observed in Grown-In Defects in the Bulk of Standard Czochralski-Si for MOS LSIs
- Octahedral Void Structure Observed at the Grown-In Defects in the Bulk of Standard CZ-Si for MOSLSIs