Wang S | National Cheng Kung Univ. Tainan Twn
スポンサーリンク
概要
関連著者
-
Wang S
National Cheng Kung Univ. Tainan Twn
-
Wang Shui
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
-
TSAI Hao
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
-
Wang Shui
Microelectronics Laboratory Department Of Electrical Engineering National Cheng Kung University
-
Wang Shui
Microelectronics Lab. Dept. Of Electrical Engineering National Cheng Kung University
-
Wu S
Department Of Electronics Engineering Cheng Shiu University
-
Wu San
Department Of Electronics Engineering Cheng Shiu Institute Of Technology
-
Wu San
Microelectronics Laboratory Department Of Electrical Engineering National Cheng Kung University
-
YEH Fang
Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University
-
CHENG Ching
Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University
-
SUN Shi
R&D
-
SHIAO Ming
Institute of Materials Engineering, National Chung Hsing University
-
SUN Shi
R&D, Wafertech
-
Yeh Fang
Microelectronics Laboratory Department Of Electrical Engineering National Cheng Kung University
-
Tsai Hao
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
-
Shiao Ming
Institute Of Materials Engineering National Chung Hsing University
-
Sun Shi
R&d
-
Cheng Ching
Microelectronics Laboratory Department Of Electrical Engineering National Cheng Kung University
著作論文
- Schottky/Two-Dimensional Hole Gas Silicon Barrier Diodes with Single and Coupled Delta-Doped Wells
- Influence of Nitrogen Doping on the Barrier Properties of Sputtered Tantalum Carbide Films for Copper Metallization : Semiconductors
- Characterization of Tungsten Carbide as Diffusion Barrier for Cu Metallization