TSAI Hao | Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

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概要

• 同名の論文著者
• Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung Universityの論文著者

関連著者

• Wang S

  National Cheng Kung Univ. Tainan Twn

• Wang Shui

  Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University

• TSAI Hao

  Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

• SUN Shi

  R&D

• SHIAO Ming

  Institute of Materials Engineering, National Chung Hsing University

• SUN Shi

  R&D, Wafertech

• Tsai Hao

  Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University

• Shiao Ming

  Institute Of Materials Engineering National Chung Hsing University

• Sun Shi

  R&d

著作論文

• Influence of Nitrogen Doping on the Barrier Properties of Sputtered Tantalum Carbide Films for Copper Metallization : Semiconductors
• Characterization of Tungsten Carbide as Diffusion Barrier for Cu Metallization

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