Cha Ho-young | School Of Electrical And Computer Engineering Cornell University

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著作論文

Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors(Session 6B : Wide Bandgap Materials and Devices, Power Devices)
Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors(Session 6B : Wide Bandgap Materials and Devices, Power Devices)
Strain Effects in van der Pauw (VDP) Stress Sensor Fabricated on (111) Silicon
Design Consideration of High Power LED Arrays for Backlight Unit Applications(Session8B: High-Frequency, Photonic and Sensing Devices)
Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients(Session 6A : TFTs and Sensors)
4H-SiC Avalanche Photodiodes for 280nm UV Detection
4H-SiC Avalanche Photodiodes for 280nm UV Detection
Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients(Session 6A : TFTs and Sensors)
Nanoscale Capacitance-Voltage Characterization of Two-Dimensional Electron Gas in AlGaN/GaN Heterostructures
Design Consideration of High Power LED Arrays for Backlight Unit Applications(Session8B: High-Frequency, Photonic and Sensing Devices)
Electrical and Optical Modeling of 4H-SiC Avalanche Photodiodes
Errors in Pi-Coefficients Due to the Strain Effects in Resistor Stress Sensor on (001) Silicon
Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors
State-of-the-Art AlGaN/GaN-on-Si Heterojunction Field Effect Transistors with Dual Field Plates
Normally-Off AlGaN/GaN-on-Si Power Switching Device with Embedded Schottky Barrier Diode
Nanoscale Capacitance–Voltage Characterization of Two-Dimensional Electron Gas in AlGaN/GaN Heterostructures

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