Park Sung-kye | Pg.1 R&d Division Lg Semicon Co. Ltd.

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概要

• PARK Sung-Kyeの詳細を見る
• 同名の論文著者
• Pg.1 R&d Division Lg Semicon Co. Ltd.の論文著者

関連著者

• Park Sung-kye

  Pg.1 R&d Division Lg Semicon Co. Ltd.

• Yoon Gyu-han

  Hyundai Electronics Industries Co. Ltd.

• Lee S‐h

  Memory Research And Development Division Hyundai Electronics Industries

• Lee Seong-hoon

  Dram Design Memory Product & Technology Development Division Hyundai-electronics Industries

• Lee Sang-ho

  Pg.1 R&d Division Lg Semicon Co. Ltd.

• Lee Young-chul

  Pg.1 R&d Division Lg Semicon Co. Ltd.

• Lee H

  大阪大 産科研

• Park Sung-Kye

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Lee Young-Chul

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Suh Moon-Sik

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Lee Sang-Ho

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Lee Hyung

  Dept. of Electrical Engineering, Andong National University

• Yoon Gyu-Han

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Lee Hyung

  Dept. Of Electrical Engineering Andong National University

• Suh Moon-sik

  Pg.1 R&d Division Lg Semicon Co. Ltd.

• Lee Y‐c

  Kyungpook National Univ. Daegu Kor

• Suh Moon-Sik

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Lee Young-Chul

  PG.1, R&D Division, LG Semicon Co. Ltd.

• Park S‐k

  Korea Inst. Sci. And Technol. Seoul Kor

• Jung J‐w

  Hanyang Univ. Seoul Kor

• Kang Dae-kwan

  Hyundai Electronics Industries Co. Ltd.

• Park Sung-kun

  Department Of Electronic Engineering Kyungpook National University

• Jung Jong-wan

  Hyundai Electronics Industries Co. Ltd.

• LEE Youngjong

  Hyundai Electronics Industries Co., Ltd.

• Lee Youngjong

  Hyundai Electronics Industries Co. Ltd.

• PARK Sung-Kye

  Hyundai Electronics Industries Co., Ltd.

• Park Sung-kye

  Hyundai Electronics Industries Co. Ltd.

• KANG Dae-Gwan

  Hyundal Micro Electronics Co., Ltd.

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著作論文

• Moisture Induced Hump Characteristics of Shallow Trench-Isolated Sub-1/4μm nMOSFET
• Moisture Induced Hump Characteristics of Shallow Trench-Isolated Sub-1/4μm nMOSFET
• Moisture Induced Hump Characteristics of Shallow Trench-Isolated Sub-1/4 μm nMOSFET
• Study of Optimization Guidelines on Nitrogen Concentration in Nitrided Oxide for Logic and Dynamic Random Access Memory Application
• New Optimazation Guidelines on Nitrogen Concentration in NO Gate Dieletrics for Advanced Logic and DRAM Application

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