Lau Wai-shing | School Of Electrical And Electronic Engineering Nanyang Technological University
スポンサーリンク
概要
- LAU Wai-Shingの詳細を見る
- 同名の論文著者
- School Of Electrical And Electronic Engineering Nanyang Technological Universityの論文著者
関連著者
-
Lau Wai-shing
School Of Electrical And Electronic Engineering Nanyang Technological University
-
Tee Kian-meng
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
TEE Kheng-Chok
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd
-
See Kwang-seng
School Of Electrical And Electronic Engineering Nanyang Technological University
-
Liao Hong
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Tee Kheng-chok
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Chan Lap-hung
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Quek Elgin
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Lee Jae
Department Of Acupuncture & Moxibustion College Of Oriental Medicine
-
Chan Lap-hung
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
Quek Elgin
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
SEE Kwang-Seng
School of Electrical and Electronic Engineering, Nanyang Technological University
-
LIAO Hong
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd
-
Eng Chee-wee
School Of Electrical And Electronic Engineering Nanyang Technological University
-
LEE Jae
Department of Metallurgy, The University of Tokyo
-
Li Kun
Department Of Applied Physics And Materials Research Center The Hong Kong Polytechnic University
-
Lee Jae
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Jiang Yao-yao
Institute Of Microelectronics
-
ENG Chee-Wee
School of Electrical and Electronic Engineering, Nanyang Technological University
-
LIM Vanissa
Institute of Microelectronics
-
TRIGG Alastair
Institute of Microelectronics
-
Vigar David
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Toh Suey-li
Department Of Chemistry National University Of Singapore
-
Eng Chee-Wee
School of Electrical and Electronic Engineering, Nanyang Technological University, Block S2, Nanyang Avenue, Singapore 639798, Republic of Singapore
-
Li Kun
Department Of Biological Engineering College Of Environment & Chemical Engineering Yanshan Unive
-
Lee James
Department Of Forensic Science Central Police University
-
Chan Lap
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
TOH Suey-Li
Department of Chemistry, National University of Singapore
-
VIGAR David
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd.
-
Chan Lap
Department Of Diagnostic Radiology Kwong Wah Hospital
-
Li Kun
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Lau Wai-Shing
School of Electrical and Electronic Engineering, Nanyang Technological University, Block S2, Nanyang Avenue, Singapore 639798, Republic of Singapore
-
Chan Lap-Hung
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D St.2, Singapore 738406, Republic of Singapore
-
Liao Hong
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D St.2, Singapore 738406, Republic of Singapore
-
Lee James
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd 60 Woodlands Industrial Park D St. 2, Singapore 738406, Republic of Singapore
-
Li Kun
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D St.2, Singapore 738406, Republic of Singapore
-
Jiang Yao-Yao
Institute of Microelectronics, 11 Science Park Road, Singapore Science Park II, Singapore 117685, Republic of Singapore
-
See Kwang-Seng
School of Electrical and Electronic Engineering, Nanyang Technological University, Block S2, Nanyang Avenue, Singapore 639798, Republic of Singapore
-
Chan Lap
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd., 60 Woodlands Industrial Park D St. 2, Singapore 738406, Republic of Singapore
-
Vigar David
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd., 60 Woodlands Industrial Park D St. 2, Singapore 738406, Republic of Singapore
-
Vigar David
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd 60 Woodlands Industrial Park D St. 2, Singapore 738406, Republic of Singapore
-
Tee Kheng-Chok
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D St.2, Singapore 738406, Republic of Singapore
-
Toh Suey-Li
Department of Chemistry, National University of Singapore, 3 Science Drive 3, Singapore 117543, Republic of Singapore
-
Quek Elgin
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D St.2, Singapore 738406, Republic of Singapore
-
Trigg Alastair
Institute of Microelectronics, 11 Science Park Road, Singapore Science Park II, Singapore 117685, Republic of Singapore
著作論文
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
- Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
- Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source-Drain Diffusion Length
- Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
- An Improved Shift-and-Ratio Effective Channel Length Extraction Method for Metal Oxide Silicon Transistors with Halo/Pocket Implants
- Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source–Drain Diffusion Length
- Enhanced Hot-Hole Induced Degradation of Strained p-Channel Metal Oxide Semiconductor Transistors in Complementary Metal Oxide Semiconductor Technology with 2.0 nm Gate Oxide