Chan Lap-hung | Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.

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概要

• 同名の論文著者
• Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.の論文著者

関連著者

• Lau Wai-shing

  School Of Electrical And Electronic Engineering Nanyang Technological University

• Tee Kian-meng

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.

• Chan Lap-hung

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.

• Quek Elgin

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.

• SEE Kwang-Seng

  School of Electrical and Electronic Engineering, Nanyang Technological University

• LIAO Hong

  Department of Technology Development, Chartered Semiconductor Manufacturing Ltd

• TEE Kheng-Chok

  Department of Technology Development, Chartered Semiconductor Manufacturing Ltd

• LEE Jae

  Department of Metallurgy, The University of Tokyo

• Lee Jae

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd

• Lee Jae

  Department Of Acupuncture & Moxibustion College Of Oriental Medicine

• See Kwang-seng

  School Of Electrical And Electronic Engineering Nanyang Technological University

• Liao Hong

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd

• Tee Kheng-chok

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd

• Chan Lap-hung

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd

• Quek Elgin

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd

• Li Kun

  Department Of Biological Engineering College Of Environment & Chemical Engineering Yanshan Unive

• Li Kun

  Department Of Applied Physics And Materials Research Center The Hong Kong Polytechnic University

• TOH Suey-Li

  Department of Chemistry, National University of Singapore

• ENG Chee-Wee

  School of Electrical and Electronic Engineering, Nanyang Technological University

• Toh Suey-li

  Department Of Chemistry National University Of Singapore

• Li Kun

  Department Of Technology Development Chartered Semiconductor Manufacturing Ltd

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著作論文

• Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
• Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
• Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source-Drain Diffusion Length

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