Lee Jae | Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
スポンサーリンク
概要
- LEE Jae Gonの詳細を見る
- 同名の論文著者
- Department Of Technology Development Chartered Semiconductor Manufacturing Ltdの論文著者
関連著者
-
LEE Jae
Department of Metallurgy, The University of Tokyo
-
Lau Wai-shing
School Of Electrical And Electronic Engineering Nanyang Technological University
-
Lee Jae
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Tee Kian-meng
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
Lee Jae
Department Of Acupuncture & Moxibustion College Of Oriental Medicine
-
Chan Lap-hung
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
Quek Elgin
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd.
-
SEE Kwang-Seng
School of Electrical and Electronic Engineering, Nanyang Technological University
-
LIAO Hong
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd
-
TEE Kheng-Chok
Department of Technology Development, Chartered Semiconductor Manufacturing Ltd
-
See Kwang-seng
School Of Electrical And Electronic Engineering Nanyang Technological University
-
Liao Hong
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Tee Kheng-chok
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Chan Lap-hung
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Quek Elgin
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
-
Li Kun
Department Of Biological Engineering College Of Environment & Chemical Engineering Yanshan Unive
-
Li Kun
Department Of Applied Physics And Materials Research Center The Hong Kong Polytechnic University
-
TOH Suey-Li
Department of Chemistry, National University of Singapore
-
Toh Suey-li
Department Of Chemistry National University Of Singapore
-
Li Kun
Department Of Technology Development Chartered Semiconductor Manufacturing Ltd
著作論文
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology
- Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11μm Dual Gate Oxide CMOS Technology