Influence of Heterointerface Abruptness on Electrorefractive Effect in InGaAs/InAlAs Five-Layer Asymmetric Coupled Quantum Well
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概要
- 論文の詳細を見る
An InGaAs/InAlAs five layer asymmetric coupled quantum well (FACQW) is expected to produce a large electrorefractive index change and is a promising structure for high-performance phase modulators. However, because an FACQW is composed of ultrathin layers, poor abruptness in heterointerface may deteriorate the electrorefractive effect. We therefore investigated theoretically the influence of abruptness of heterointerfaces in an FACQW on the electrorefractive effect of the FACQW. In the analysis, it is assumed that the composition profile in a heterointerface is exponential, and the thickness of the transition layer $L$ is defined. With the increase in $L$, the absorption edge is blue-shifted, which deteriorates the electrorefractive index change of the FACQW especially in the case of $L\geq 3$ monolayer (ML). In addition, we propose an improved FACQW structure, which is expected to exhibit a large electrorefractive index even in the case of $L=3$ ML.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2010-04-25
著者
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ARAKAWA Taro
Graduate School of Engineering, Yokohama National University
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TADA Kunio
Graduate School of Engineering, Kanazawa Institute of Technology
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Taro Arakawa
Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Kunio Tada
Graduate School of Engineering, Kanazawa Institute of Technology, Atago Toyo Building, 1-3-4 Atago, Minato, Tokyo 105-0002, Japan
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Nobuo Haneji
Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Iseri Yuji
Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Yuji Iseri
Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan
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Arakawa Taro
Graduate School of Engineering Yokohama National Univ
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