Technical Obstacles to Thin Film Transistor Circuits on Plastic
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概要
- 論文の詳細を見る
Two main technical obstacles must be overcome to build a fruitful business in the nascent flexible microelectronics industry: the self-heating effect of thin film transistors (TFTs), and the thermal and mechanical durability of flexible devices. The self-heating effect is controlled through TFT shape, TFT electrical performance, dimensional reductions, and energy-efficient circuits. Plastic engineering is one of the keys to solving thermal and mechanical durability problems faced by flexible microelectronics devices. Once these obstacles are cleared, TFT circuits on plastic will spawn a new industry and markets for plastic large-scale integrations.
- 2008-06-25
著者
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INOUE Satoshi
Frontier Device Research Center, Seiko Epson Corporation
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Karaki Nobuo
Frontier Device Research Center Seiko Epson Corporation
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Hara Hiroyuki
Frontier Device Research Center Seiko Epson Corporation
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Miyasaka Mitsutoshi
Advanced Product Development Department
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Hara Hiroyuki
Frontier Device Research Center, Seiko Epson Corporation, 281 Fujimi, Fujimi, Nagano 399-0293, Japan
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Kawai Hideyuki
Advanced Product Development Department, Seiko Epson Corporation, 281 Fujimi, Fujimi, Nagano 399-0293, Japan
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Nebashi Satoshi
Advanced Product Development Department, Seiko Epson Corporation, 281 Fujimi, Fujimi, Nagano 399-0293, Japan
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Miyasaka Mitsutoshi
Advanced Product Development Center, Seiko Epson Corporation, 281 Fujimi, Suwa, Nagano 399-0293, Japan
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Miyasaka Mitsutoshi
Advanced Product Development Department, Seiko Epson Corporation, 281 Fujimi, Fujimi, Nagano 399-0293, Japan
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Karaki Nobuo
Frontier Device Research Center, Seiko Epson Corporation, 281 Fujimi, Fujimi, Nagano 399-0293, Japan
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Inoue Satoshi
Frontier Device Research Center Seiko Epson Corporation
関連論文
- Extraction Technique of Trap Density at Grain Boundaries in Polycrystalline-Silicon Thin-Film Transistors with Device Simulation
- Invited Asynchronous Architecture and Its Impact on Low-Power TFT CPUs (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))
- Invited Asynchronous Architecture and Its Impact on Low-Power TFT CPUs (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))
- Requirements for thin film transistor circuit on plastic (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Requirements for thin film transistor circuit on plastic (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Technical Obstacles to Thin Film Transistor Circuits on Plastic
- Extraction Technique of Trap Density at Grain Boundaries in Polycrystalline-Silicon Thin-Film Transistors with Device Simulation
- Evaluation of Thin-Film Photodiodes and Development of Thin-Film Phototransistor
- Location and Orientation Control of Si Grain by Combining Metal-Induced Lateral Crystallization and Excimer Laser Annealing
- Location Control of Si Thin-Film Grain Using Ni Imprint and Excimer Laser Annealing