Characteristics of Thermally Treated Quantum-Dot Infrared Photodetector
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概要
- 論文の詳細を見る
We investigated the device performances for a post-growth thermally treated In0.5Ga0.5As/GaAs quantum-dot infrared detector (QDIP). Device characteristics, such as dark current, photoluminescence (PL), and photocurrent spectra, have been studied and compared for the as-grown and thermally treated QDIPs. After the thermal treatment with a SiO2 capping layer, the dark current was increased, the PL peak position was blue-shifted, and the detection wavelength was redshifted due to In/Ga interdiffusion in the quantum dot (QD) structure. Furthermore, the activation energies estimated from the integrated PL intensities agreed well with the peak positions of the photocurrent spectra.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-07-15
著者
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Choi Won
Nano Device Research Center Kist
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HWANG Sung
Nano Device Research Center, KIST
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SHIN Jae
Nano Device Research Center, KIST
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LEE Seung-Woong
QSRC, Dongguk University
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Lee Jung
Nano Device Research Center Korea Institute Of Science And Technology
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Song Jin
Nano Device Research Center Korea Institute Of Science And Technology
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Han Haewook
Nano-terahz Photonics Lab Postech
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Lee Jung
Nano Device Research Center, KIST, P.O.Box 131, Cheongryang, Seoul 130-650, Korea
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Choi Won
Nano Device Research Center, KIST, P.O.Box 131, Cheongryang, Seoul 130-650, Korea
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Song Jin
Nano Device Research Center, KIST, P.O.Box 131, Cheongryang, Seoul 130-650, Korea
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Hwang Sung
Nano Device Research Center, KIST, P.O.Box 131, Cheongryang, Seoul 130-650, Korea
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Han Haewook
Nano-TeraHz Photonics lab, POSTECH, Pohang, Kyungbuk 790-784, Korea
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Lee Seung-Woong
QSRC, Dongguk University, Jung-Ku, Seoul 100-715, Korea
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