In-situ Visualization of Local Field Enhancement in an Ultra Sharp Tungsten Emitter under a Low Voltage Scanning Transmission Electron Microscope
スポンサーリンク
概要
- 論文の詳細を見る
We found that field emissions from a multi-walled carbon nanotube soften the bottom of the tungsten by Joule heating, and the coulomb attraction to the nanotube finery pulled off from the tungsten tip resulted in an ultra sharp apex of the tungsten probe having 5 nm in radius of curvature. We also found that a locally enhanced field at the probe apex can be visualized using scanning transmission electron microscopy (STEM) under low accelerating voltage operation. The primary electrons were deflected by the local field out of the detector and created a dark shadow surrounding the probe apex in the STEM image. Simple Rutherford scattering model could be adopted to analyze the local electric field at the tip apex.
- 2007-06-25
著者
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ISHIDA Masahiko
CREST JST, Japan Science and Technology Co.
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OKADA Satoshi
CREST-JST
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MATSUI Shinji
CREST-JST
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Fujita Jun-ichi
CREST JST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan
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Ikeda Yuta
CREST, Japan Science and Technology Agency (JST), Kawaguchi, Saitama 332-0012, Japan
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Higashi Kodai
CREST, Japan Science and Technology Agency (JST), Kawaguchi, Saitama 332-0012, Japan
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Nakazawa Shotaro
CREST, Japan Science and Technology Agency (JST), Kawaguchi, Saitama 332-0012, Japan
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Ishida Masahiko
CREST JST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan
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Matsui Shinji
CREST JST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan
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Okada Satoshi
CREST JST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan
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