画素ブロックの相対的独自性指標と領域抽出への応用

概要

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In this paper, we propose an effective measure to compute “rareness” of pixel blocks by comparing with other blocks and also introduce a region segmentation method to extract significant blocks such as defects in a visual inspection system. Our basic idea is based on the simple and realistic assumption that the target blocks that are to be detected must have statistical characteristics different from the other blocks. In order to calculate the measure, we utilize histograms of three features: luminance, gradient, and gradient direction. Some blocks that have extraordinary characteristics can automatically be detected by estimating the relative distances between all blocks. Results of experiments involving the use of actual images have proved that our method works well for extracting a rare defect region without a priori knowledge about the defects.
社団法人電気学会の論文