WDT法より発生させたデンドライトの三次元構造測定

概要

論文の詳細を見る
The purpose of this study is use of a three dimension (3D) measuring system that can automatically measure surface condition. We applied the WDT method that is one of the migration acceleration testing methods, to calculate the spatial variation of the electrodes of ion immigration on a glass epoxy printed wiring board. We also investigated the spatial shape and its variation of dendrite after short circuit for the cases of uniform and nonuniform field strength. As a result the phenomenon of immigration peak of separated matter from cathode to anode due to nonuniform was reported.The moving of the peak of the separated matter is supposed to be due to Cu(OH)2s change in accumulation status. Under the nonuniform and uniform situation, the behavior of separated matter will change after occurring short circuit between the electrodes. Therefore in order to avoid the progress of ion immigration, it is necessary to pay attention to the field strength in hardwiring and the curvature so that the field strength of the wiring pattern cannot be very high.
社団法人電気学会の論文
2003-07-01