Effect of Contact Point Distribution to the High-Frequency Impedance on a Coaxial Connector
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概要
- 論文の詳細を見る
In this paper, we investigate an equivalent circuit for estimating connector contact failure, which saves computation resource significantly. The simulation results, validated by measurement, reveal that both the asymmetric contact distribution and fewer contact points increase the inductance on the connector. Using this lumped element circuit, different cable contact scenarios at the connection, i.e. the contact distribution and the number of contact points, can be simply simulated by changing the inductance term in the model.
- 社団法人電子情報通信学会の論文
- 2009-11-12
著者
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Fan Jun
Emc Laboratory Missouri University Of Science And Technology
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Fan Jun
Missouri University Of Science And Technology
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Fan Jun
Missouri Univ. Sci. And Technol.
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Hayashi Yu‐ichi
Tohoku Univ. Sendai‐shi Jpn
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Hayashi Yu‐ichi
Tohoku University
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Hayashi Yu-ichi
Graduate School Of Information Sciences Tohoku University
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Hayashi Yu-ichi
Tohoku University
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Wu Songping
Missouri University of Science and Technology
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Mizuki Takaaki
Tohoku University
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Sone Hideaki
Tohoku University
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Hayashi Yu-ichi
Department Of Electrical And Communication Engineering Graduate School Of Engineering Tohoku Univers
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Sone Hideaki
Cyberscience Center Tohoku University
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Mizuki Takaaki
Cyberscience Center Tohoku University
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HAYASHI Yu-ichi
Department of Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University
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