Sone Hideaki | Tohoku University

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概要

• 同名の論文著者
• Tohoku Universityの論文著者

関連著者

• Sone Hideaki

  Tohoku University

• Sone Hideaki

  Cyberscience Center Tohoku University

• Inoue Hiroshi

  Akita Univ.

• Ishida H

  Tohoku Bunka Gakuen Univ. Sendai Jpn

• Inoue Hiroshi

  Akita University

• ISHIDA Hiroyuki

  Tohoku Bunka Gakuen University

• TANIGUCHI Masanari

  Tohoku Bunka Gakuen University

• TAKAGI Tasuku

  Tohoku Bunka Gakuen University

• Takagi Tasuku

  Tohoku University

• Inoue Hiroshi

  Akita Univ. Jpn

• Suzuki Shosuke

  Tohoku Bunka Gakuen University

• Hayashi Yu-ichi

  Tohoku University

• Mizuki Takaaki

  Tohoku University

• Inoue Hiroshi

  Akita Univ. Akita Jpn

• Fan Jun

  Emc Laboratory Missouri University Of Science And Technology

• Fan Jun

  Missouri University Of Science And Technology

• Fan Jun

  Missouri Univ. Sci. And Technol.

• Hayashi Yu‐ichi

  Tohoku Univ. Sendai‐shi Jpn

• Hayashi Yu‐ichi

  Tohoku University

• Hayashi Yu-ichi

  Graduate School Of Information Sciences Tohoku University

• Aoki Takafumi

  Tohoku Univ. Sendai‐shi Jpn

• SATOH Akashi

  National Institute of Advanced Industrial Science and Technology

• Wu Songping

  Missouri University of Science and Technology

• Hayashi Yu-ichi

  Department Of Electrical And Communication Engineering Graduate School Of Engineering Tohoku Univers

• MINEGISHI Shigeki

  Tohoku Gakuin University

• Mizuki Takaaki

  Cyberscience Center Tohoku University

• Homma Naofumi

  Tohoku Univ. Sendai‐shi Jpn

• Kayano Yoshiki

  Akita Univ. Akita Jpn

• Satoh Akashi

  National Institute Of Advance Industrial Science And Technology

• SUGAWARA Takeshi

  Tohoku University

• AOKI Takafumi

  Tohoku University

• HAYASHI Yu-ichi

  Department of Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University

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著作論文

• Effect of Contact Point Distribution to the High-Frequency Impedance on a Coaxial Connector
• Formation Mechanism of Dark Bridge between Contacts with Very Slow Opening Speed(Contact Phenomena,Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2005))
• Formation Mechanism of Dark Bridge between Contacts with Very Slow Opening Speed (国際セッション IS-EMD2005) -- (Contact Phenomena)
• Relationship between Length and Diameter of Contact Bridge Formed under Thermal Equilibrium Condition(Contact Phenomena, IS-EMD2004-Recent Development of Electro-Mechanical Devices)
• Relationship between Length and Diameter of Contact Bridge Formed under Thermal Equilibrium Condition(Session 7 : Contact Phenomena)
• Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current

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