C-12-5 Methodology for Layout-Based Diagnosis of VLSI Chips Considering Temperature Distribution
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概要
- 論文の詳細を見る
- 社団法人電子情報通信学会の論文
- 2007-08-29
著者
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WU Xing
Department of Precision Science and Technology, School of Engineering, Osaka University
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Wu Xing
Department Of Information Systems Engineering Graduate School Of Information Science And Technology
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MIURA Katsuyoshi
Department of Information System Engineering, Graduate School of Information Science and Technology,
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NAKAMAE Koji
Department of Information System Engineering, Graduate School of Information Science and Technology,
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Nakamae Koji
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Miura Katsuyoshi
Department Of Information System Engineering Graduate School Of Information Science And Technology O
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Miura Katsuyoshi
Department Of Information Systems Engineering Graduate School Of Information Science And Technology
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Nakamae Koji
Department Of Information Systems Engineering Graduate School Of Information Science And Technology
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