Total-Electron-Yield X-Ray Standing-Wave Measurements of Multilayer X-Ray Mirrors for Interface Structure Evaluation
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-06-30
著者
-
MURAMATSU Yasuji
Japan atomic energy research institute (JAERI), Kansai Research Establishment
-
GULLIKSON Eric
Lawrence Berkeley Laboratory
-
PERERA Rupert
Lawrence Berkeley Laboratory
-
Gullikson Eric
Center For X-ray Optics Lawrence Berkeley National Laboratory
-
Perera Rupert
Center For X-ray Optics Lawrence Berkeley National Laboratory
-
Muramatsu Y
Ntt Lifestyle And Environmental Technol. Lab. Tokyo Jpn
-
TAKENAKA Hisataka
NTT Advanced Technology Corporation
-
Takenaka Hisataka
Ntt Advanced Technology Corp.
-
Gullikson E
Center For X-ray Optics Lawrence Berkeley National Laboratory
関連論文
- First Principles Study of Core-hole Effect on Fluorine K-edge X-ray Absorption Spectra of MgF_2 and ZnF_2
- Holes in the Valence Band of Superconducting Boron-Doped Diamond Film Studied by Soft X-ray Absorption and Emission Spectroscopy(Condensed matter : electronic structure and electrical, magnetic, and optical properties)
- Local Structure of Nitrogen Atoms in a Porphine Ring of meso-Phenyl Substituted Porphyrin with an Electron-Withdrawing Group Using X-ray Photoelectron Spectroscopy and X-ray Absorption Spectroscopy
- Electronic Structure Analysis of Iron(III)-Porphyrin Complexes by X-ray Absorption Spectra at the C, N and Fe K-Edges
- Hole Distribution in (Sr,Ca,Y,La)_Cu_O_ Compounds Studied by X-ray Absorption and Emission Spectroscopy(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- High-Resolution Soft X-Ray Emission Spectra of Crystalline Carbon Nitride Films Deposited by Electron Cyclotron Resonance Sputtering
- Soft X-ray absorption spectra in the CK region of carbon black and spectral analysis using the discrete variational Xα method
- Characterization of Carbon Films on the Japanese Smoked Roof Tile " Ibushi-Kawara" by High-Resolution Soft X-ray Spectroscopy
- Total-Electron-Yield X-Ray Standing-Wave Measurements of Multilayer X-Ray Mirrors for Interface Structure Evaluation
- Transient Properties of Organic Electroluminescent Diode Using 8-HydroXyquinoline Aluminum Doped with Rubrene as an Electro-Optical Conversion Device for Polymeric Integrated Devices
- Performance Test of Fresnel Zone Plate with 50nm Outermost Zone Width in Hard X-ray Region
- Diffraction-limited Microbeam with Fresnel Zone Plate Optics in Hard X-Ray Regions
- Near-edge X-ray Absorption Fine Structure of PdO at O K-edge
- Laser-Induced Shock Compression of Tantalum to 1.7 TPa
- X-Ray Study on Low-Temperature Behavior of an Incommensurate Superstructure in the New High-T_c Superconductor Bi_2Sr_2Ca_1Cu_2O_
- Quantitative and chemical-state analyses of surface oxygen on graphite oxides using total-electron-yield soft X-ray absorption spectroscopy
- High-Transmittance Free-Standing Aluminum Extreme Ultraviolet Filter
- GaSb-Growth Study by Realtime Crystal-Growth Analysis Systemu Using Synchrotron Radiation Photoelectron Spectroscopy
- Near-edge X-ray Absorption Fine Structure of PdO at O K-edge
- Characterization of Carbon Films on the Japanese Smoked Roof Tile “Ibushi-Kawara” by High-Resolution Soft X-ray Spectroscopy
- Element-Selective Observation of Electronic Structure Transition between Semiconducting and Metallic States in Boron-Doped Diamond Using Soft X-ray Emission and Absorption Spectroscopy
- Performance Test of Fresnel Zone Plate with 50 nm Outermost Zone Width in Hard X-ray Region
- Quantitative and Fingerprint Analysis Method of Nitrogen in Graphitic Carbon Materials Using Total-Electron-Yield Soft X-ray Absorption Spectroscopy
- Diffraction-limited Microbeam with Fresnel Zone Plate Optics in Hard X-Ray Regions