Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite

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概要

• 論文の詳細を見る

• We investigate the behavoir of a friction force microscope tip on a crystal at tip velocities above 1 μm/s. Cleaved mica and highly oriented pyrolytic graphite (HOPG) are observed by a friction force microscope in ambient operation. A regular sawtoothed signal corresponding to atomic-level stick-slip is observed in each case at tip velocities lower than 1.5μm/s. However, in the case of observing mica at tip velocities above 1.5 μm/s, regularity of the signal becomes unstable. Sometimes no sawtoothed signal is observed and even if there were a saw-toothed signal, the pitch of the saw-toothed signal would be larger than that corresponding to the crystal structure. In the case of observing HOPG, clear regularity is detected at tip velocities above 20 μm/s. The difference is considered to be caused by the hydrophilic/hydrophobic property of each crystal. For HOPG, the mechanical property of the cantilever is the limitation. For a 200-μm-long and 20-μm-wide rectanglar cantilever, 95 kHz and 417 kHz spectrums, corresponding to the natural frequency of the cantilever for deflection and torsion with the tip in contact, start to mask the stick-slip signal as the scanning velocity is increased.

• 社団法人応用物理学会の論文
• 2000-06-30

著者

• KAWAKATSU Hideki

  Institute of Industrial Science, The University of Tokyo

• Hoshi Y

  Institute Of Industrial Science The University Of Tokyo

• HOSHI Yasuo

  Institute of Industrial Science, University of Tokyo

• KAWAGISHI Takayoshi

  Institute of Industrial Science, University of Tokyo

• Kawakatsu Hideki

  Institute Of Industrial Science The University Of Tokyo

• Hoshi Yasuo

  Institute Of Industrial Science University Of Tokyo

• Kawagishi T

  Toshiba Corp. Otawara Jpn

• Kawakaktsu Hideki

  Institute of Industrial Science, University of Tokyo

• Kawagishi Takayoshi

  Institute of Industrial Science, the University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

関連論文

• Building and testing of a liquid Atomic Force Microscope for imaging of biological samples (特集 工学とバイオ)
• Fabrication of Silicon-Based Filiform-Necked Nanometric Oscillators
• Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope
• A Silicon Based Nanometric Oscillator for Scanning Force Microcopy Operating in the 100 MHz Range
• Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite
• Suppression of Cone Formation on Carbon Target during Sputtering
• Effect of Oxygen Content on Defect Formation in Pure-Silica Core Fibers
• Radiation Effects on Pure Silica Core Optical Fibers by γ-Rays : Relation between 2 eV Band and Non-Bridging Oxygen Hole Centers
• Improvement of Radiation Resistance of Pure Silica Core Fibers by Hydrogen Treatment
• SIM-13 SIMULATION OF PICO-FORCE DETECTION IN LATERAL-MODE DYNAMIC AFM(Simulations of Micro/Nano Scale Phenomena IV,Technical Program of Oral Presentations)
• Dual Optical Levers for Atomic Force Microscopy
• Feasibility Studies on a Nanometric Oscillator Fabricated by Surface Diffusion for Use as a Force Detector in Scanning Force Microscopy
• Fabricating Five Atomic Force Microscopes with an Extremely Low Budget —A Student Project—
• Observation of Self-Assembled Monolayer Using the Lateral Resonance of the Cantilever in the Contact and Noncontact Regions
• New FM Detection Techniques for Scanning Probe Microscopy

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