Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-06-30
著者
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KAWAKATSU Hideki
Institute of Industrial Science, The University of Tokyo
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SAYA Daisuke
Institute of Industrial Science University of Tokyo
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FUKUSHIMA Kimitake
Institute of Industrial Science University of Tokyo
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Fukushima K
Institute Of Industrial Science University Of Tokyo
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Kawakatsu H
Univ. Tokyo Tokyo Jpn
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Kawakatsu Hideki
Institute Of Industrial Science The University Of Tokyo
関連論文
- Building and testing of a liquid Atomic Force Microscope for imaging of biological samples (特集 工学とバイオ)
- A Novel Nanoscale Metal Transistor Fabricated by Conventional Photolithography
- (マイクロマシン)
- Fabrication of Silicon-Based Filiform-Necked Nanometric Oscillators
- Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope
- Effects on CO Oxidation Activity of Nano-Scale Au Islands and TiO_2 Support Prepared by the Ionized Cluster Beam Method
- Epitaxial Growth of TiO_2 Rutile Thin Films on Sapphire Substrates by a Reactive Ionized Cluster Beam Method
- Molecular Orientations of 1,4-dithioketo-3,6-diphenyl-pyrrolo-[3,4-c]-pyrroleon Crystalline Substrates
- A Silicon Based Nanometric Oscillator for Scanning Force Microcopy Operating in the 100 MHz Range
- Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite
- SIM-13 SIMULATION OF PICO-FORCE DETECTION IN LATERAL-MODE DYNAMIC AFM(Simulations of Micro/Nano Scale Phenomena IV,Technical Program of Oral Presentations)
- (マイクロマシン)
- Dual Optical Levers for Atomic Force Microscopy
- Feasibility Studies on a Nanometric Oscillator Fabricated by Surface Diffusion for Use as a Force Detector in Scanning Force Microscopy
- Fabricating Five Atomic Force Microscopes with an Extremely Low Budget —A Student Project—
- Observation of Self-Assembled Monolayer Using the Lateral Resonance of the Cantilever in the Contact and Noncontact Regions
- New FM Detection Techniques for Scanning Probe Microscopy