New FM Detection Techniques for Scanning Probe Microscopy
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概要
- 論文の詳細を見る
New FM demodulation techniques capable of detecting the fast frequency deviation of a cantilever of a noncontact atomic force microscope are proposed and their features were demonstrated by experiments. The techniques entail the frequency conversion of an input FM signal to a pair of zero-Hz-centered signals with a mutual phase difference of 90 deg, differentiation or Hilbert transformation, multiplication and subtraction. Since the center frequency and scale factor are determined by different processes, a high sensitivity, a fast response and a precise center frequency are achievable at the same time. The developed circuitry is capable of detecting a minimum frequency shift of 0.1 Hz. The maximum response bandwidth is 100 kHz.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-07-15
著者
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Kobayashi Dai
Crest Japan Science And Technology Agency
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Kawakatsu Hideki
Institute Of Industrial Science The University Of Tokyo
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Kobayashi Dai
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama-ken 332-0012, Japan
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Kawai Sigeki
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505 Japan
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Kawai Shigeki
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505 Japan
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Kawakatsu Hideki
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505 Japan
関連論文
- Building and testing of a liquid Atomic Force Microscope for imaging of biological samples (特集 工学とバイオ)
- Fabrication of Silicon-Based Filiform-Necked Nanometric Oscillators
- Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope
- A Silicon Based Nanometric Oscillator for Scanning Force Microcopy Operating in the 100 MHz Range
- Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite
- SIM-13 SIMULATION OF PICO-FORCE DETECTION IN LATERAL-MODE DYNAMIC AFM(Simulations of Micro/Nano Scale Phenomena IV,Technical Program of Oral Presentations)
- Dual Optical Levers for Atomic Force Microscopy
- Feasibility Studies on a Nanometric Oscillator Fabricated by Surface Diffusion for Use as a Force Detector in Scanning Force Microscopy
- Fabricating Five Atomic Force Microscopes with an Extremely Low Budget —A Student Project—
- Observation of Self-Assembled Monolayer Using the Lateral Resonance of the Cantilever in the Contact and Noncontact Regions
- New FM Detection Techniques for Scanning Probe Microscopy