Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection

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Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection
Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
Scanning Force Microscopy Studies of Domain Structure in BaTiO_3 Single Crystals
Investigation of the Peptide Conformation by Measuring Force Curve using AFM
Measurement of the Length of the α Helical Section of a Peptide Directly Using Atomic Force Microscopy
Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
Resonant Magnetotunneling in AlGaAs/GaAs Triple Barrier Diodes : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Two Dimensional Electrons and Ions
Measurement of Local Density of States by Scanning Tunneling Spectroscopy at Low Temperature : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Charge Density Waves
Effect of Atomic Force on the Surface Corrugation of 2H-NbSe_2 Observed by Scanning Tunneling Microscopy
Effect of Amines on Single-Walled Carbon Nanotubes in Organic Solvents : Control of Bundle Structures
Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
Surface Observation and Modification of Si Substrate in NH_4F and H_2SO_4 Solutions
Surface Observation and Modification of Si Substrate in Solutions
Electrochemical Scanning Tunneling Microscopy and Atomic Force Microscopy Observationson Si(111) in Several Solutions
Ultrasonic Atomic Force Microscope with Overtone Excitatioru of Cantilever
Atomic Structure of Hydrogen-Terminated Si(111) Surfaces by Hydrofluoric Acid Treatments
Heat-Induced Phase Separation of Self-Assembled Monolayers of a Fluorocarbon-Hydrocarbon Asymmetric Disulfide on a Au(111) Surface ( Scanning Tunneling Microscopy)
Lateral Conduction Model for Intermolecular Interaction of Self-Assembled Monolayers
Identification of Materials using Direct Force Modulation Technique with Magnetic AFM Cantilever ( Scanning Tunneling Microscopy)
Nanometer Modifications of Non-Conductive Materials Using Resist-Films by Atomic Force Microscopy
Monolayer Nitridation of Si(001) Surfaces
Monolayer Nitridation of Si(001) Surfaces
Preparatiorn of Self-Assembled Mercaptoalkanoic Acid Multilayers on GaAs (110) Surfaces
Nanometer-Scale Wires of Monolayer Height Alkanethiols on AlGaAs/GaAs Heterostructures by Selective Chemisorption
Step Formation on Au (111) Observed by Scanning Tunneling Microscope
AFM Observation of Self-Assembled Monolayer Films on GaAs (110)
Local Properties of Phase-Separated Polymer Surfaces by Force Microscopy
Evaluation of Standard Defects Using Surface Acoustic Waves Generated by Phase Velocity Scanning of Laser Interference Fringes
Piezoelectric Actuator for Scanning Tunneling Microscopy : A: Applications and Fundamentals
Evaluation of the Elastic Properties of a Cantilever Using Resonant Frequencies
Evaluation of MeV Si Implanted Si Using Beam Acoustic Method : Ultrasonic Imaging and Microscopy
Characterizaton of Ion Implanted Layer Using Ion-Induced Acoustic Signal : Physical Acoustics

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