Solid-Phase Reactions in Al Alloy/TiN/Ti/Si Systems Observed by In Situ Cross-Sectional TEM

スポンサーリンク

概要

著者

関連論文

Threshold Voltage Control Using Floating Back Gate for Ultra-Thin-Film SOI CMOS
Silicon Wafer Direct Bonding through the Amorphous Layer
Superjunction by Wafer Direct Bonding
Photooxidation of Propene to Propene Oxide by Molecular Oxygen over Zinc Oxide Dispersed on Silica
Effect of Hydrothermal Treatment of Titania-pillared Montmorillonite for Photocatalytic Degradiation of Dibutyl Phthalate in Water
Photooxidation of Propene by Molecular Oxygen over FSM-16
Silicon Wafer Direct Bonding without Hydrophilic Native Oxides
H_2 Partial Pressure Dependences of CH_3 Radical Density and Effects of H_2 Dilution on Carbon Thin-Film Formation in RF Discharge CH_4 Plasma
Effect of Rare Gas Dilution on CH_3 Radical Density in RF-Discharge CH_4 Plasma
Effect of Pore-Diffusionn on Catalytic Reduction of NO over Co- and Cu-Mordenites
Intelligent Power IC with Partial SOI Structure
Soft X-Ray Emission Spectroscopic Analysis of Pt Silicides (Pt_2Si, PtSi)
A CMOS Time-to-Digital Converter LSI with Half-Nanosecond Resolution Using a Ring Gate Delay Line (Special Issue on ASICs for Automotive Electronics)
Characterization of HF-Treated Si Surfaces by Photoluminescence Spectroscopy
3-Dimensional Specific Thickness Glass Diaphragm Lens for Dynamic Focusing
Microwave Energy Transmission System for Microrobot (Special Issue on Micromachine Technology)
Solid-Phase Reactions in Al Alloy/TiN/Ti/Si Systems Observed by In Situ Cross-Sectional TEM
60GHz mixer MMIC for millimeter wave radar
Critical Layer Thickness of n-In_Al_AS/In_Ga_As/In_Al_AS Pseudomorphic Heterostructures Studied by Photoluminescence
Structural Study of the SiC(0001)(√ X √)-R30°Surfaces by Reflection High-Energy Electron Diffraction Rocking Curves : Semiconductors
Reconstructions of 6H-SiC(0001) Surfaces Studied by Scanning Tunneling Microscopy and Reflection High-Energy Electron Diffraction

もっと見る

スポンサーリンク