Order-Disorder Transition in Sputter-Deposited Silver-Zinc Alloy Films
スポンサーリンク
概要
- 論文の詳細を見る
An order-disorder between β' and β phases was observed to take place reversibly at 510 K in sputter-deposited AgZn alloy films of 30 nm thickness. The β' phase was found to exist in the as-deposited alloy film and the transition could be described by the order parameter of Bragg-Williams theory.
- 社団法人応用物理学会の論文
- 1991-06-01
著者
-
MINEMURA Tetsuroh
Hitachi Research Laboratory, Hitachi, Ltd.
-
Minemura Tetsuroh
Hitachi Research Laboratory Hitachi Ltd.
-
Andoh Hisashi
Hitachi Research Laboratory Hitachi Ltd.
-
Maeda Yoshihiro
Hitachi Research Laboratory Hitachi Ltd.
関連論文
- Crystalline Fraction of Microcrystalline Silicon Films Prepared by Plasma-Enhanced Chemical Vapor Deposition Using Pulsed Silane Flow
- Accurate Determination of the Urbach Energy of a-Si:H Thin Films by Correction for the Interference Effect
- In Situ Optical Measurement Using Optical Fibers for a-Si:H Ultra-Thin Films: Theoretical and Numerical Analysis
- Single-Beam Overwrite with a New Erase Mode of In_3 SbTe_2 Phase-Change Optical Disks : Media
- Single-Beam Overwrite with a New Erase Mode of In_3SbTe_2 Phase-Change Optical Disks
- Disk Structure for High Performance Overwritable Phase-Change Optical Disks : PHASE CHANGE MEDIA I
- Crystallizing Mechanism and Recording Properties of In_3SbTe_2 Phase-Change Optical Disks
- 2.5 Inch Flat-Type Phase-Change Optical Disk Drive
- Effects of Back-Channel Etching on the Performance of a-Si:H Thin-Film Transistors
- Structural Change during Annealing of Amorphous Indium-Tin Oxide Films Deposited by Sputtering with H_2O Addition
- Secondary Electron Emission Characteristics of MgO Thin Films Prepared by an Advanced Ion-Plating Method
- Ion-Plating Deposition of MgO Thin Films
- Oxidation Mechanism of Ultra Thin TiN Films Prepared by an Advanced Ion-plating Method
- Ultra Thin TiN Films Prepared by an Advanced Ion-Plating Method
- Order-Disorder Transition in Sputter-Deposited Silver-Zinc Alloy Films
- Thermo-Photometric Study on Phase Transitions in Sputter-Deposited Ag-Zn Alloy Thin Films