Ab initio Molecular Orbital Study of Water Absorption and Hydrolysis of Chemical Vapor Deposited SiOF Films I
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概要
- 論文の詳細を見る
We investigated the mechanism of water absorption and hydrolysis of F-doped SiO_2 (SiOF) films using the ab initio molecular orbital (MO) method with small SiF_n(OH)_<4-n> (n = 0-3) tetrahedral model clusters. We focused on the dependence of the reactivity of these clusters with both OH^- and H_2O on the number of F atoms bonded with a Si atom. The reactivity of defect sites such as non bridging oxygens (NBOs) and free volumes around Si-F bonding were also investigated. The calculations revealed the following. SiOF films are more reactive with OH^- than with H_2O. Si atoms linked with multiple F atoms become more reactive with H_2O by reducing the activation barrier of the -OH coordination to Si, and with OH^- by increasing the stabilization energy of the pentacoordinated-Si formation. Multiple H_2O attacks at sparse, i.e., sparsely packed, network sites increase the adsorption energy and reduce the activation barrier. NBO defects also promote successive H_2O adsorption.
- 社団法人応用物理学会の論文
- 1997-04-30
著者
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Katsumata R
Toshiba Corp. Kawasaki Jpn
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Katsumata Ryota
Advanced Semiconductor Devices Research Labs. R&d Center Toshiba Corp.
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MIYAJIMA Hideshi
Microelectronics Engineering Lab., Toshiba Corp.
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HAYASAKA Nobuo
Microelectronics Engineering Lab., Toshiba Corp.
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NAKASAKI Yasushi
ULSI Research Labs., R & D Center, Toshiba Corp.
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KATSUMATA Ryota
ULSI Research Labs., R & D Center, Toshiba Corp.
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Hayasaka N
Microelectronics Engineering Lab. Toshiba Corp.
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Nakasaki Y
Advanced Semiconductor Devices Research Labs. R&d Center Toshiba Corp.
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Miyajima H
Seiko Epson Corp. Nagano Jpn
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Katsumata Ryota
ULSI Research Labs. R & D Center, Toshiba Corp.
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Nakasaki Yasushi
ULSI Research Labs. R & D Center, Toshiba Corp.
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