Rietveld Refinement of the Structure of TlSr_2CaCu_2O_7 by X-Ray Powder Diffraction Data
スポンサーリンク
概要
- 論文の詳細を見る
Single phase TlSr_2CaCu_2O_7 was synthesized, and the crystal structure was refined from X-ray powder diffraction data using Rietveld analysis. The structure has single Tl-O sheets and tetragonal symmetry (a=3.7859 Å, c=12.104 Å) with space group P4/mmm, and is similar to TlBa_2CaCu_2O_7 and Tl_<0.5>Pb_<0.5>Sr_2CaCu_2O_7 (1212 type). Possible substitution of about 14% of Ca-sites with Tl ions was suggested.
- 社団法人応用物理学会の論文
- 1990-01-20
著者
-
KAMO Tomoichi
Hitachi Research Laboratory, Hitachi Ltd.
-
DOI Toshiya
Hitachi Research Laboratory, Hitachi Ltd.
-
USAMI Katsuhisa
Hitachi Research Laboratory of Hitachi Ltd.
-
Usami Katsuhisa
Hitachi Research Laboratory
-
Doi Toshiya
Hitachi Research Laboratory Hitachi Ltd.
-
Kamo Tomoichi
Hitachi Research Laboratory Hitachi Ltd.
関連論文
- Degradation by Mechanical Grinding and Recovery by Annealing in the Superconducting Phases of the Bi-Pb-Sr-Ca-Cu-O System
- Formation of the High-T_c Phase in Rapidly Quenched Bi-Pb-Sr-Ca-Cu-O Ceramics
- Properties of a Fluorine-Doped Y-Ba-Cu-Oxide Superconductor Prepared by Hot-Pressing
- Dopant Effects on the Superconductivity in the Bi-Sr-Ca-Cu-O System
- Comparison of Transport Properties between Tl-(1223) and Tl-(2223) Phases of Tl-Ba-Ca-Cu-O Systems
- Magnetization and Anisotropy in Single Crystals of Tl-(1223) Phase of Tl-Sr-Ca-Cu-O System
- The Anisotropy of Transport Critical Current Densities in Tl_2Ba_2Ca_2Cu_3O_x Thin Films under Magnetic Fields up to 20 T
- Properties of Tl_2Ba_2Ca_2Cu_3O_x Thin Films with a Critical Temperature of 122 K Prepared by Excimer Laser Ablation
- Phase Transition in YBa_2Cu_3O_ through Hydrogen Ion Implantation : Electrical Properties of Condensed Matter
- Relationship between Crystal Structures and Solid Solution of Tl-Sr-Ca-Cu-O and Tl-Ba-Ca-Cu-O Superconductors
- Magnetic Properties of the (1223) Phase of Tl-Sr-Ca-Cu-O Superconductors with Strong Pinning in Liquid Nitrogen
- Existence of Superconducting States Above 30 K in Sr-V-O Systems Doped with Various Elements
- Crystalline Structure and Superconducting Properties of Rapidly Quenched BiSrCaCu_2O_x Ceramics : Electrical Properties Condensed Matter
- Observation of Allende and Antarctic meteorites by monochromatic X-ray CT based on synchrotron radiation
- 溶融炭酸塩型燃料電池の寿命モデル
- 溶融炭酸塩型燃料電池カソ-ドの分極モデル
- Observation of Compositional Separation in CoCrTa Thin Film Using Transmission Electron Microscope with Imaging Filter
- High Spatial Resolution Elemental Mapping of Multilayers Using a Field Emission Transmission Electron Microscope Equipped with an Imaging Filter
- X-Ray Computerized Tomography Using Monochromated Synchrotron Radiation : Techniques, Instrumentations and Measurement
- X-Ray Absorption Studies of High-T_c YBa_2Cu_3O_x : Condensed Matter
- Precise EXAFS Analysis for High-T_c YBa_2Cu_3O_x : Condensed Matter
- X-Ray Sensing Pickup Tube
- Improvement of Spatial Resolution of Monochromatic X-ray CT Using Synchrotron Radiation
- Effects of Hydrogen Ion Implantation on Superconductivity in YBa_2Cu_3O_ : Electrical Properties of Condensed Matter
- Superconducting Bi-Sr-Ca-Cu-O Thin Films by Sputtering : Electrical Properties of Condensed Matter
- Weak-Link Characteristics and Transport Properties of Tl-1223 Tape-Shaped Wire
- Flux Pinning Characteristics in Tl Series Superconductors
- Ag-Sheathed Tl-Ba-Ca-Cu-O Superconductor Tape with T_c≈120 K : Electrical Properties of Condensed Matter
- Elemental Mapping Using a Field Emission Transmission Electron Microscope with an Imaging Filter
- Transport Critical Current Densities in Uniaxially and Biaxially Oriented Tl_1 (Ba_Sr_)_2Ca_2Cu_3O_9 Superconducting Films on Ag and SrTiO_3 Substrates Prepared by a Spray Pyrolysis Method
- Rietveld Refinement of the Structure of TlSr_2CaCu_2O_7 by X-Ray Powder Diffraction Data
- X-Ray Fluorescence Analysis of Hg in SiO_2 Films Deposited by Hg-Sensitized Photo-CVD
- Temperature Dependence of Lattice Parameters of YBa_2Cu_3O_x Superconductor at Low Temperature
- Study of X-Ray Reflectivity from Si Film /Interface Layer/Si Substrate and Application to Low-Temperature Epitaxially Grown Si/Si Substrate
- XPS Determination of Amount of Incorporated Rare Gas in Amorphous Silicon Films Produced with Reactive Sputtering Method
- Measurement of Strain in Locally Oxidized Silicon using Convergent-Beam Electron Diffraction
- Raman Studies of Internal Stress and Crystallinity of Pulse-Laser-Irradiated Silicon on Sapphire (SOS) in Relation to Hall Mobility
- High Resolution Monochromatic X-Ray Tomography Using Synchrotron Radiation
- Study of Quantitative Elemental Analysis of Monochromatic X-Ray CT Using Synchrotron Radiation
- Reversible binding of NO to Fe(II)edta.