Electrical Breakdown of Plasma-Polymerized Styrene Thin Films
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概要
- 論文の詳細を見る
The electrical breakdown of plasma-polymerized styrene thin film (PPS) was studied by taking advantage of self-healing. The electric strength F_B was almost independent of temperature from -196 to 200℃, and strongly depended on the rate of voltage increase even at a slow rate of increase. The breakdown characteristics were influenced by the electrode metal and the ambient atmosphere, but not by X-ray irradiation or photoillumination. The experimental results are used to discuss the breakdown mechanism of PPS through existing breakdown theories. As a result, no single breakdown process was considered as a possible breakdown mechanism, and we thus obtained important conditions for presenting a new breakdown model; the breakdown of PPS will be determined by a thermal criterion, and it will be closely related to a temperature-independent injection process.
- 社団法人応用物理学会の論文
- 1982-03-05
著者
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Hikita M
Department Of Electrical Engineering Nagoya University
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Hikita Masayuki
Nagoya University
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MATSUDA Akinori
Department of Electrical Engineering, Nagoya University
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Sawa Goro
Department Of Electrical And Electronic Engineering Mie University
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Sawa Goro
Department Of Electronic Engineering Mie University
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Ieda Masayuki
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Nagao Masayuki
Department Of Electrical And Electronic Engineering Toyohashi University Of Technology:(present Addr
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Nagao Masayuki
Department Of Electrical And Electronic Engineering Toyohashi University Of Technology
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Matsuda Akinori
Department Of Electrical Engineering Nagoya University
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Matsuda Akinori
Department Of Applied Chemistry Graduate School Of Engineering Osaka City University
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Hikita Masayuki
Department Of Electrical Electronic And Computer Engineering Kyushu Institute Of Technology
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Ieda Masayuki
Department Of Electronics Aichi Institute Of Technology
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NAGAO Masayuki
Department of Electrical & Electronic Engineering, Toyohashi University of Technology
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