Induced Stress-Sensitivity of Ion-Bombarded Silicon-Metal Contacts

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概要

著者

Mizushima Yoshihiko
The Electrical Communication Laboratory Nippontelegraph And Telephone Public Corporation
Ariyoshi Hisashi
The Electrical Communication Laboratory Nippontelegraph And Telephone Public Corporation
Ariyoshi Hisashi
The Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
CHINO Ken-ichi
The Electrical Communication Laboratory, Nippontelegraph and Telephone Public Corporation
Mizushima Yoshihiko
The Electrical Communication Laboratories Nippon Telegraph And Telephone Public Corporation
Chino Ken-ichi
The Electrical Communication Laboratory Nippontelegraph And Telephone Public Corporation
Chino Ken-ichi
The Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
Nakamura Yoshiharu
Faculty Of Engineering Fukui University

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