Effect of Surface Polishing on the Stress-Sensitivity of a Schottky-Barrier Diode
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1968-09-05
著者
-
Ariyoshi Hisashi
The Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
-
CHINO Ken-ichi
The Electrical Communication Laboratory, Nippontelegraph and Telephone Public Corporation
-
Chino Ken-ichi
The Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
関連論文
- Induced Stress-Sensitivity of Ion-Bombarded Silicon-Metal Contacts
- Negative Resistance in Compensated Silicon Diodes
- Stress Effect of Gold-Doped and Gamma-Irradiated Schottky-Barrier Diodes
- Effect of Surface Polishing on the Stress-Sensitivity of a Schottky-Barrier Diode