Large-Signal Analysis on Negative-Resistance Diode Due to Punch-Through-Injection and Transit-Time Effect

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1973-03-05

著者

• Kawarada Kuniyasu

  The Electrical Communication Laboratories Nippon Telegraph And Telephone Public Corporation

• MIZUSHIMA Yoshihiko

  The Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation

• Mizushima Yoshihiko

  The Electrical Communication Laboratories Nippon Telegraph And Telephone Public Corporation

関連論文

• Properties of a New Avalanche Diode Oscillator Computed by a Large-Signal, Self-Consistent Simulation
• Large-Signal Analysis on Negative-Resistance Diode Due to Punch-Through-Injection and Transit-Time Effect
• Sustairting of the Low-Field Avalanche in the GaAs Thin-Film Switch
• Induced Stress-Sensitivity of Ion-Bombarded Silicon-Metal Contacts
• Negative Resistance in Compensated Silicon Diodes
• Stress Effect of Gold-Doped and Gamma-Irradiated Schottky-Barrier Diodes
• Interface-wave Instability in a Parallel Arrangement of Two Semiconductor Sheets with Transverse Magnetic Field

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