Thick Target Yields of Characteristic X-Rays by p, d, ^3He^+ and ^4He^+ Bombardments

概要

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Characteristic X-ray yields by p, d, ^3He^+ and ^4He^+ bombardments have been measured for various thick metallic elements in the incident energy range from 90 to 360 keV. The combination of incident particles, target materials and produced characteristic X-rays is given as: (a) Al-K, Ti-K, Ni-K, Cu-K, Ni-L, Cu-L, Zr-L, Mo-L, Ag-L, Cd-L, Sn-L, Ta-M, W-M, Pt-M and Pb-M for proton bombardment, (b) Al-K, Ti-K, Cu-K, Ni-L, Cu-L, Zr-L, Mo-L, Ag-L, Cd-L, Sn-L, Ta-M, W-M, Pt-M and Pb-M for deuteron bombardment, (c) Al-K, Ni-L, Cu-L, Mo-L, Ag-L and W-M for ^3He^+ bombardment, (d) Al-K, Ni-L, Cu-L, Mo-L, Ag-L, W-M, Pt-M and Pb-M for ^4He^+ bombardment. The thick target yields against particle energy have been found to increase more steeply as target atomic number becomes larger. The behaviors of yield ratios of I_μ(d)/I_μ(P) and I_μ(^4He^+)/I_μ(^3He^+) have been qualitatively explained by the effect of average charge of the incident particles.
社団法人応用物理学会の論文
1970-11-05