Bit Error Rate Measurement of a Measuring System Designed for Superconducting Digital Circuits(Special Issue on Superconductive Electronics)

概要

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We have developed a measuring system for high-Tc superconducting single-flux quantum circuits and evaluated its performance in terms of bit error rate (BER) measurement for given signal voltage levels. The system includes magnetic shields and a high-frequency test fixture mounted on a closed-cycle cooler. The test fixture is made of non-magnetic material. The transmission characteristics of the measuring system were evaluated by using a vector network analyzer at frequencies ranging from 40MHz to 20GHz. The operating temperature of the measuring system ranges from 20K to room temperature. We connected a 12-GHz wideband pulse amplifier to the system and evaluated its high-speed transmission characteristics. We used a standard 50-Ω mictostrip line as an impedance-matched sample. The signal used in the experiment was a 2^<15> -1 pseudo random bit signal (PRBS) at 3Gbps. As a result, the output voltage required for an output driver under the experimental condition was 18.8mV in order to obtain a resolution of BER measurement of 10^<-12>.
社団法人電子情報通信学会の論文
2001-01-01