ED2000-83 / SDM2000-83 1/f noise in Schottky barrier structure
スポンサーリンク
概要
- 論文の詳細を見る
We critically review and compare all the possible mechanisms for generation of low frequency noise in Schottky barrier structure, including mobility and diffusivity fluctuation, thermal activation and tunneling involving bulk traps and a new random walk model involving interface traps, and show how the noise measurement can be utilized to obtain useful information on bulk and/or interface traps and further diagnose the materials and certain process conditions for the fabrication of Schottky barrier structure.
- 社団法人電子情報通信学会の論文
- 2000-06-23
著者
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Kim D.
School Of Elec. Eng. And Computer Science Kyungpook National Univ.
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Lee J.I.
Photonics Research Center, KIST
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Han I.K.
Photonics Research Center, KIST
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Kim H.J.
Photonics Research Center, KIST
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Chovet A.
LPCS UMR CNRS
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Kim H.j.
Photonics Research Center Kist
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Lee J.
On Leave At Basic S$t Program Kistep
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Kim D.
School Of Electrical Engineering Kookmin Univ.
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Han I.k.
Photonics Research Center Kist
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Han I.
Photonics Research Center Kist
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Lee J.
Photonics Research Center, KIST, Cheongryang
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Grini J.
LPCS UMR CNRS
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Dimitriadis S.
Dept. Physics, Univ. of Thessaloniki
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Dimitriadis S.
Dept. Physics Univ. Of Thessaloniki
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Kim H.
Photonics Research Center Kist
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