圧縮下にある高分子材料測定のためのX線カメラの試作

概要

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A compression X-ray camera is described in the present paper, devised for obtaining an X-ray photograph by transmission technique for the crystalline high-polymeric materials under uniaxial compression up to 2000 kg/cm^2. The compression is applied by a press screwed by a manual worm-gearing which are set on the camera. The compressive force can be measured by a special gauge planed in the camera in series under the sample holder, and it can be kept constant, when desired for the stress constant experiments, by driving the press during the exposure to compensate the ralaxed stress of the sample. A technique for an accurate measurement of the small radial shift of the diffraction peak induced by the compressive stress is also described where a flat film is used. The shift was measured by a direct comparison of the shifted peak under a microscope with the peak obtained under no applied stress and registered, by the use of the metal shield, on the same film in the immediate neighbor of the shifted peak.
社団法人日本材料学会の論文
1968-12-15