位置敏感型X線検出器による一結晶内の応力測定

概要

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Stresses in a single crystal specimen or any individual grain of polycrystal specimen were measuerd by the use of one dimensional position sensitive proportional counter(PSPC). A problem on such project is how to measure stresses experimentally because continuous Debye-Scherrer(DS)diffraction ring is only just a spot from a grain and appeared on an imaginary DS circle from polycrystal specimen. Therefore, it is important to convert from such a spot to measurable diffraction curve. We adopted a PSPC and a specimen oscillating mechanism in the present study. Large grained 3% silicone iron specimens were prepared and 211 diffraction on each grain under elastic loading were measured by Cr-Kα x-rays radiation after determination of orientation(n_1n_2n_3)[w_1w_2w_3]on each grain by Laue method. A specimen stage with the Ψ and φ rotating attachment was oscillated upon the x-ray irradiated point on the specimen surface in Ψ and Ψ+90° directions by the use of two stepping motors. The oscillating areas were ±3° in the Ψ direction and ±0.5° in the Ψ+90° direction, respectively and a measurable diffraction intensity curve from a DS spot was converted by this operation. Stresses under uniaxial loading were measured by this technique and we concluded that stresses in a grain can be measured without the use of lattice parameters on the non-stresses condition.
社団法人日本材料学会の論文
1999-12-15