Magnetic and Electrical Properties of Cu_xTiS_2
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概要
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Magnetic susceptibility and electrical resistivity were measured on polycrystallinesamples of random intercalation compounds of Cu.TiS. with 0<,X'<0.3. Single-phase samples with IT structures were prepared for 0<,v30.2. In 4.2K37'3300K,the samples showed paramagnetic behavior with small temperature dependence, sug-gesting itinerant electron magnetism. The resistivity is described by a constant termplus a T' one. The exponent m takes values of between l and 2, contrary to theprevious result. This result suggests that the scattering is not dominated by the usualelectron-phonon scattering only.[intercalation compound, TiS., copper, magnetic susceptibility, electrical ll resistivityl
- 社団法人日本物理学会の論文
- 1991-08-15
著者
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Tazuke Yuichi
Department Of Physics Faculty Of Science Hokkaido University
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Hashimoto Toshikazu
Ntt Photonics Laboratories
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Hashimoto T
Toshiba Corp. Kawasaki‐shi Jpn
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Hashimoto T
The Authors Are With Toshiba
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HASHIMOTO Toshikazu
Department of Pathology, Kyoto Prefectural University of Medicine
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KUWAZAWA Kazunobu
Department of Physics,Faculty of Science,Hokkaido University
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ONISHI Yasusi
Department of Physics,Faculty of Science,Hokkaido University
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Onishi Yasusi
Department Of Physics Faculty Of Science Hokkaido University
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Kuwazawa Kazunobu
Department Of Physics Faculty Of Science Hokkaido University
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Hashimoto Toshikazu
Department Of Anesthesiology And Critical Care Medicine Hokkaido University Graduate School Of Medic
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